Aug 17, 2022  
2022-2023 Academic Catalog 
    
2022-2023 Academic Catalog
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MATE 263 - Semiconductor Device Reliability and Failure Mechanisms


3 unit(s)
Overview of semiconductor device reliability in terms of the reliability criteria, reliability testing methodologies, and accelerated lifetime test methods. Various industry cases studies on failure model analysis and failure mitigation techniques will also be presented.

Grading: Letter Graded


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